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AFM Raman Imaging




AFM Raman of CNT Nanowire on Silicon
 afm_updated_281_01  raman_updated_278_01

Figure 1: (Left) AFM image shows an isolated nanowire of carbon nanotube on a Silicon surface . (Right) Online Raman map of the CNT nanowire obtained online pixel-by-pixel with the AFM image (left). The Raman map shows Raman integrated intensity between the carbon bands at 1540cm-1 and 1640cm-1.

Raman Mapping Parameters:
Objective:
50 X LWD N.A=0.5
Raman step size (X & Y): 0,2 µm
Laser 532 nm, grating: 600 l/mm
Measurement time: 5s/point

WSxM software has been used for image processing of the pictures above: I. Horcas et al. Rev. Sci. Instrum. 78, 013705 (2007).

raman_two_lines_292   graph2_450

Figure 2: (Left) A CNT nanowire Raman map shows a band shift of the G-band along the nanowire (1575cm-1, green) and the graphite cluster aggregates (1580cm-1, red).
 

 

 



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