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Integrated Microscopy
FIB Etched Trench
SEM/AFM Integration
Antenna Probes
Nanonics Systems Can Use Any Probe
Antenna Probes
Large Z-Range Imaging of Razor Blade
AFM/Raman of Strained Si Transistor
AFM Raman of CNT Nanowire on Silicon
Online AFM/Raman of an Si/SiO2 Grid
Unique Probes
Antenna Probes
AFM/Raman of Si/SiO2 Grid
AFM/Thermal in Non-Contact Mode
Thermal Imaging of Optical Fiber
Nano biological AFM NSOM solutions
Image of Standard Silicon AFM Tip
Second Harmonic Imaging and Non-Linear Microscopy
Depth Profiling of a Polymer Blend
Micro-electronic Device Structures
Photonic Band Gap Materials
AFM Raman Imaging
AFM, NSOM and Capicatance
SRAM
AFM, NSOM and Capacitance Imaging

The first simultaneous NSOM/Capacitance ever to be produced.
  
 
10x10 micron AFM Topgraphy  NSOM Image of the same region
     

Only Nanonics Double Wire Electrodes can produce simultaneous NSOM/Capacitance measurements

These images were obtained by the MultiView 1000™
 
Simultaneous Capacitance Image of the same region
 

 

 



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