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Semiconductors
Nanoindentation
Online AFM/Raman of an Si/SiO2 Grid
NanoIndentation and Raman Characterization
AFM with On-Line Raman of Strained Silicon
MultiProbe NanoIndentation & AFM Profiling with On-line Raman
Raman Imaging of Germanium Quantum Dots
Stressed Silicon
Raman-AFM of MEMs Device
AFM/Raman of Si/SiO2 Grid
Resistance Imaging of PN Junction
Nanoindentation on Silicon
FIB Etched Trench
Thermal imaging of SRAM
TFT in Liquid Crystal Display
Silicon Semiconductor
Thermal Imaging of V Grooved Quantum Laser
Electrical Imaging of SRAM
Topography of SRAM
Reflection NSOM of SRAM
Topography of SRAM
AFM, NSOM and Capacitance
SRAM
AFM, NSOM and Capacitance Imaging
The first simultaneous NSOM/Capacitance ever to be produced.
10x10 micron AFM Topgraphy
NSOM Image of the same region
Only Nanonics Double Wire Electrodes can produce simultaneous NSOM/Capacitance measurements
These images were obtained by the
MultiView 1000™
Simultaneous Capacitance Image of the same region
Phone: +972-2-6789573
Fax: +972-2-6480827
USA Toll Free (direct to sales): 1-800-289-7162
Patch Clamping
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Photonic Band Gap
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atomic force microscopy
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scanning probe microscope
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near field optics
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NanoLithography
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SNOM
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AFM raman
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