AFM scan (53.2x53.2 µm) of textile fibers with tens of microns of Z range (29.19 µm)

2D (Left) and 3D (Right) AFM topographic images are presented above.

Nano-textile technology deals with nanometric domains (e.g. nano particle coatings) laying on micrometric fibers. Topographic imaging of such nanometric domains is challenging within the large Z topographies of the textile fibers.

The MultiView^TM SPM series efficiently addresses this challenge with its dynamic Z range. The Nanonics 3D FlatScan^TM attains a Z range of 100 µm, and can achieve even up to 200 µm in tip/sample-scanning combined modes.

Zooming AFM images (3D presentation) for locating nanometric features on micrometric textile fiber.