Home > AFM Confocal Raman & Tip Enhanced TERS Solutions > TERS > 
Print version
AFM Confocal Raman & Tip Enhanced TERS Solutions
Indentation with AFM Profiling & On-line Raman
A transparent probe with no Raman background
Ultimate in feedback without any optical interference
Ultralow working distance from above
Specialized scanning modes
Optimized TERS with single gold nanoparticle probes & tip controlled difference Raman
All Modes of SPM/NSOM/Raman/TERS
AFM/Raman of Strained Si Transistor
Online AFM/Raman of Diamond Coated Film




TERS

TERS & ANSOM WITH NANONICS SYSTEMS

NANONICS SYSTEMS ARE DESIGNED FOR ALL MODES OF NSOM & SPM WITH ONLINE SIMULTANEOUS RAMAN. 

   Nanonics systems integrate a variety of innovations that permit ultimate in TERS & Apertureless NSOM : 

 INDEPENDENT TIP & SAMPLE - MOVEMENT & CONTROL

·         Difference Raman

·         Image oversampling

·         Off Axis Z Polarization Tip placement

 mv4000_ters_370NO TIP RAMAN BACKGROUND

·         Transparent Glass Dielectric

·         Single Gold Nanoparticle

·         Exposed Tip Geometryd

 No Topographic Artifacts

·         Online AFM Autofocus

Integrated With All Microscopes

·         Upright Microscope

·         Inverted Microscope

·         Dual 4pi Microscope



Phone: +972-2-6789573 Fax: +972-2-6480827 USA Toll Free (direct to sales): 1-800-289-7162
Contact Us
Name:
E-mail:
Institution:
Phone:
Select Country:
Area of Interest:
Type in the image characters:
I would like to receive the newsletter