40 x 40 micron Topgraphy		3D image

Only Nanonics is able to produce AFM images with such a large z scan range.

The large 70 micron z scanning range of theNanonics 3D FlatScan Scanning System and the up to 500 micron tip length of the cantilevered optical fiber Nanonics Deep Trench AFM probe allows even larger topographic alteration to be readily monitored.

The image was obtained with normal force feedback in the intermittant contact mode using the MultiView 400™.